Sutar, A., Kulkarni, R. and Chhetri, A. (2018) “Simple and Low Cost IC Tester for Analog and Digital Labs”, Asian Journal For Convergence In Technology (AJCT) ISSN -2350-1146, 2(2). Available at: http://www.asianssr.org/index.php/ajct/article/view/173 (Accessed: 31January2026).