Sutar, Amol, Rashmi Kulkarni, and Ashwin Chhetri. “Simple and Low Cost IC Tester for Analog and Digital Labs”. Asian Journal For Convergence In Technology (AJCT) ISSN -2350-1146 2, no. 2 (March 21, 2018). Accessed January 31, 2026. http://www.asianssr.org/index.php/ajct/article/view/173.