Mekala S, Pyatla VV, Vootla SB, Ambigalla A, Rao Y M. Automated Attendance and Monitoring system using Machine Learning. AJCT [Internet]. 18Aug.2022 [cited 29Apr.2026];8(2):66-9. Available from: https://www.asianssr.org/index.php/ajct/article/view/1230