Simple and Low Cost IC Tester for Analog and Digital Labs

  • Amol R. Sutar University of Pune
  • Rashmi R. Kulkarni
  • Ashwin Chhetri
Keywords: Analog IC, Digital IC, IC Tester, Microcontroller

Abstract

Integrated Circuits (ICs) are the important component of each and every electronic circuit and can be used for wide variety of purposes. Sometime due to faulty ICs the circuit doesn’t work. It takes lot of efforts to troubleshoot the circuit and confirm whether the circuit is creating problem or the IC is faulty. So the proposed project is designed to confirm whether the IC under consideration is properly working or not. Unlike the IC testers available in the market today which are usually expensive, this IC tester is affordable and user-friendly. This Digital and Analog IC tester is constructed using microcontroller along with a keyboard and a display unit. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This IC tester can be used to test a wide variety of ICs which includes simple logic gates and also sequential and combinational ICs like flip-flops, counters, shift registers etc. This tester able to identify which particular logic gate is faulty in that ICs. This tester can also test frequently required analog ICs in Laboratories like Operational amplifiers, Timers etc.

References

[1] Y. Bertrand, F. Azaı¨s, M.-L. Flottes, and R. Lorival, “A Successful Distance-Learning Experience for IC Test Education,” Proc. Int’l Conf.erence Microelectronic Systems Education,pp. 20-21, July 1999. [2] H. Yousif Taha Yousif Elamin “Microcontroller based Integrated IC Tester” Int. Journal of Engineering Research and Applications ISSN : 2248-9622, Vol. 5, Issue 2, ( Part -2) February 2015, pp.118-122 [3] Miss M.A.Tarkunde, Mrs.A.A.Shinde, “IC Tester using 89s52 Microcontroller”, International Journal Of Computational Engineering Research (ijceronline.com) Vol. 2, Issue. 7 [4] Anindya Bhattacharya, “Digital Integrated Circuit Tester (Using AT89s51 Microcontroller)” International Journal of Emerging Technology and Advanced Engineering, ISSN 2250-2459, ISO 9001:2008 Certified Journal, Volume 3, Issue 6, June 2013. [5] Mazidi, J Mazidi, R. McKinlay, ”The 8051 Microcontroller And Embedded Systems ”,Pearson Publication
Published
2018-03-21
How to Cite
Sutar, A., Kulkarni, R., & Chhetri, A. (2018). Simple and Low Cost IC Tester for Analog and Digital Labs. Asian Journal For Convergence In Technology (AJCT) ISSN -2350-1146, 2(2). Retrieved from http://www.asianssr.org/index.php/ajct/article/view/173
Section
Article

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